Structural Characterization of Cu2ZnSnS4 Thin Films Prepared by Quenching-Assisted Coating

Abstract

In this work, the role of substrate temperature on the structure and microstructure of Cu₂ZnSnS₄ thin films was investigated. The results showed that the structure was amorphous for as-deposited films while it was polycrystalline for films prepared at elevated temperature. The grain size decreased while roughness increased with increasing substrate temperature. The obtained results gave indication that there is a relation between the structure and preparation temperature as well as heat treatment.