Effect of Indium Fractional Content on Structural, Roughness and Spectroscopic Characteristics of CuInS2 Thin Films prepared by Electron beam Epitaxy. IRAQI JOURNAL OF MATERIALS, [S. l.], v. 4, n. 2, p. 49–56, 2025. DOI: 10.2022/3kskka72. Disponível em: http://ijmaterials.com/index.php/ijm/article/view/88. Acesso em: 22 sep. 2026.