Characterization of Periodic Ag/Al2O3/SiO2/Si Multilayer Structures by Spectroscopic Ellipsometry. IRAQI JOURNAL OF MATERIALS, [S. l.], v. 5, n. 2, p. 59–66, 2026. DOI: 10.2022/zd0tc991. Disponível em: https://ijmaterials.com/index.php/ijm/article/view/130. Acesso em: 12 oct. 2026.