Characterization of Cu2S-Doped Nanostructured ZnS Thin Films Deposited on Porous Silicon. IRAQI JOURNAL OF MATERIALS, [S. l.], v. 3, n. 1, p. 33–38, 2024. Disponível em: https://ijmaterials.com/index.php/ijm/article/view/53. Acesso em: 5 sep. 2026.